发明名称 Silicon layer transfer substrate and method of manufacturing semiconductor substrate
摘要 A silicon layer transfer substrate includes a silicon substrate of a first substrate, a sacrificial layer, and a transfer silicon layer transferred to a second substrate, wherein the sacrificial layer has a silicon compound layer containing a compound of silicon and at least one element selected from a group consisting of germanium and carbon, and is provided on the silicon substrate of the first substrate, the silicon compound layer having a thickness equal to or smaller than a critical film thickness, the transfer silicon layer transferred to the second substrate is provided on the sacrificial layer, and at least either the silicon substrate or the silicon layer has a groove or a hole connected to the sacrificial layer.
申请公布号 US9018738(B2) 申请公布日期 2015.04.28
申请号 US201213365794 申请日期 2012.02.03
申请人 Fuji Xerox Co., Ltd. 发明人 Mitsui Minoru
分类号 H01L29/06;H01L21/20;H01L21/762;H01L21/02 主分类号 H01L29/06
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. A silicon layer transfer substrate comprising: a first substrate that is a silicon substrate; a sacrificial layer provided on the first substrate; a transfer silicon layer provided on the sacrificial layer, the transfer silicon layer configured to be transferred to a second substrate; and a groove or a hole formed in the silicon layer transfer substrate that extends in a thickness direction through the transfer silicon layer and through only a portion of the sacrificial layer, but not extending to the first substrate, wherein the sacrificial layer has a silicon compound layer containing a compound of silicon and at least one element selected from the group consisting of germanium and carbon, the silicon compound layer having a thickness equal to or smaller than a critical film thickness.
地址 Tokyo JP