Solid-state imaging device, imaging system, and method for driving solid-state imaging device

摘要

In a solid-state imaging device which includes column analog-to-digital conversion circuits (ADCs) for converting pixel signals output from pixels into digital signals, each of the column ADCs includes a comparator which outputs a result of voltage comparison (comparison result signal) between the voltage of the pixel signal and an analog ramp voltage; a column counter which counts a column counter clock signal, which is either a clock signal or a phase-shifted clock signal, and stores a value represented by upper bits of a count value at a time of change in the comparison result signal; and a first latch unit which stores a value represented by lower bits of the count value. A second latch unit stores the value stored in the first latch unit.

主权项

1. A solid-state imaging device which includes a plurality of sensing elements arranged in a matrix format for measuring physical quantities, and a plurality of column analog-to-digital conversion circuits (ADCs) for converting signals output from the sensing elements into digital signals, each of the column ADCs comprising:
a comparator configured to output a comparison result signal which indicates a result of voltage comparison between a voltage of a signal output from the sensing elements and an analog ramp voltage generated from a reference clock signal; a column counter configured to count a column counter clock signal, which is either the reference clock signal or a phase-shifted reference clock signal, and to store a value represented by upper bits of a count value at a time of change in the comparison result signal; a first latch unit configured to store a latch clock signal which represents a value represented by lower bits of the count value; and a second latch unit configured to store a value corresponding to the value stored in the first latch unit.