发明名称 |
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To properly perform plasma processing by rectifying a process gas in a plasma processing apparatus.SOLUTION: A plasma apparatus 1 includes: a processing container 10 housing a wafer W; a mounting table 20 provided on the bottom surface of the processing container 10 and mounting the wafer W; a first process-gas supply pipe 60 provided at the center of a ceiling surface of the processing container 10 and supplying a first process gas T1 to the inside of the processing container 10; a second process-gas supply pipe 70 provided on a side surface of the processing container 10 and supplying a second process gas T2 to the inside of the processing container 10; a rectifying-gas supply pipe 80 provided on the side surface of the processing container 10 and above the second process-gas supply pipe 70, and supplying a rectifying gas R directed downward inside the processing container 10; and a radial line slot antenna 40 radiating a microwave to the inside of the processing container 10. |
申请公布号 |
JP2015082546(A) |
申请公布日期 |
2015.04.27 |
申请号 |
JP20130218985 |
申请日期 |
2013.10.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
NEMOTO TAKENAO;NOZAWA TOSHIHISA |
分类号 |
H01L21/31;C23C16/455;H01L21/318;H05H1/46 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|