发明名称 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To properly perform plasma processing by rectifying a process gas in a plasma processing apparatus.SOLUTION: A plasma apparatus 1 includes: a processing container 10 housing a wafer W; a mounting table 20 provided on the bottom surface of the processing container 10 and mounting the wafer W; a first process-gas supply pipe 60 provided at the center of a ceiling surface of the processing container 10 and supplying a first process gas T1 to the inside of the processing container 10; a second process-gas supply pipe 70 provided on a side surface of the processing container 10 and supplying a second process gas T2 to the inside of the processing container 10; a rectifying-gas supply pipe 80 provided on the side surface of the processing container 10 and above the second process-gas supply pipe 70, and supplying a rectifying gas R directed downward inside the processing container 10; and a radial line slot antenna 40 radiating a microwave to the inside of the processing container 10.
申请公布号 JP2015082546(A) 申请公布日期 2015.04.27
申请号 JP20130218985 申请日期 2013.10.22
申请人 TOKYO ELECTRON LTD 发明人 NEMOTO TAKENAO;NOZAWA TOSHIHISA
分类号 H01L21/31;C23C16/455;H01L21/318;H05H1/46 主分类号 H01L21/31
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