| 摘要 |
<p>PROBLEM TO BE SOLVED: To obtain an appropriate result in a wafer test.SOLUTION: There is provided a semiconductor integrated circuit, including a test circuit, a plurality of signal cells, a power supply cell, and a control circuit. The test circuit performs a predetermined test on a test target circuit. The plurality of signal cells input an input signal into the test circuit and the test target circuit. The power supply cell supplies power to some of the plurality of signal cells in the test. The control circuit controls a value of the input signal from signal cells that include signal cells to which the power is not supplied and that are not used in the test, to be a predetermined value.</p> |
