发明名称 USE OF TOPOGRAPHY TO DIRECT ASSEMBLY OF BLOCK COPOLYMERS IN GRAPHO-EPITAXIAL APPLICATIONS
摘要 A method is provided for forming a patterned topography on a substrate. The substrate is provided with features formed atop that constitute an existing topography, and a template for directed self-assembly (DSA) is formed surrounding the exposed topography. Further to the method, the template is filled with a block copolymer (BCP) to cover the exposed topography, and then the BCP is annealed within the template to drive self-assembly in alignment with the topography. Developing the annealed BCP exposes a DSA pattern immediately overlying the topography. In one embodiment, the surfaces of the topography or the template are treated to alter a surface property thereof.
申请公布号 WO2015058200(A1) 申请公布日期 2015.04.23
申请号 WO2014US61392 申请日期 2014.10.20
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON U.S. HOLDINGS, INC. 发明人 RATHSACK, BENJAMEN M.;SOMERVELL, MARK H.
分类号 H01L21/302 主分类号 H01L21/302
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