| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method in which degradation of inspection precision is suppressed.SOLUTION: An inspection method that is performed when mounting an electronic component on a substrate includes the steps of: obtaining, by an imaging element, image data including the mounting region and a peripheral region of the substrate around the mounting region before mounting the electronic component on the mounting region; obtaining the image data including the mounting region and the peripheral region after mounting of the electronic component on the mounting region; comparing the image data before mounting with the image data after mounting; and determining, based on the comparison result, presence or absence of abnormality in at least one of the mounting region and the peripheral region. |
