发明名称 BASE PROFILE OF SELF-ALIGNED BIPOLAR TRANSISTORS FOR POWER AMPLIFIER APPLICATIONS
摘要 According to a bipolar transistor structure having a transistor top and a transistor bottom herein, a silicon substrate located at the transistor bottom has a collector region of a first conductivity type. An epitaxial base layer of a second conductivity type overlies, relative to the transistor top and bottom, a portion of the collector region. The epitaxial base layer has a bottom surface on the silicon substrate and a top surface opposite the bottom surface. A top region, relative to the transistor top and bottom, of the epitaxial base layer comprises a concentration of germanium having atomic compositions sufficient to avoid impacting transistor parameters, and sufficient to be resistant to selective chemical etching. A silicon emitter layer of the first conductivity type overlies, relative to the transistor top and bottom, a portion of the epitaxial base layer adjacent to the top surface of the epitaxial base layer.
申请公布号 US2015108548(A1) 申请公布日期 2015.04.23
申请号 US201314059531 申请日期 2013.10.22
申请人 International Business Machines Corporation 发明人 Dunn James S.;Liu Qizhi;Nakos James S.
分类号 H01L29/737;H01L29/06;H01L29/66 主分类号 H01L29/737
代理机构 代理人
主权项 1. A bipolar transistor structure having a transistor top and a transistor bottom, said structure comprising: a silicon substrate located at said transistor bottom and having a collector region of a first conductivity type; an epitaxial base layer of a second conductivity type overlying, relative to said transistor top and said transistor bottom, a portion of said collector region, said epitaxial base layer having a bottom surface on said silicon substrate and a top surface opposite said bottom surface, a top region, relative to said transistor top and said transistor bottom, of said epitaxial base layer comprising a concentration of germanium having atomic compositions sufficient to avoid impacting transistor parameters, and sufficient to be resistant to selective chemical etching; and a silicon emitter layer of said first conductivity type overlying, relative to said transistor top and said transistor bottom, a portion of said epitaxial base layer adjacent said top surface of said epitaxial base layer.
地址 Armonk NY US