发明名称 |
BASE PROFILE OF SELF-ALIGNED BIPOLAR TRANSISTORS FOR POWER AMPLIFIER APPLICATIONS |
摘要 |
According to a bipolar transistor structure having a transistor top and a transistor bottom herein, a silicon substrate located at the transistor bottom has a collector region of a first conductivity type. An epitaxial base layer of a second conductivity type overlies, relative to the transistor top and bottom, a portion of the collector region. The epitaxial base layer has a bottom surface on the silicon substrate and a top surface opposite the bottom surface. A top region, relative to the transistor top and bottom, of the epitaxial base layer comprises a concentration of germanium having atomic compositions sufficient to avoid impacting transistor parameters, and sufficient to be resistant to selective chemical etching. A silicon emitter layer of the first conductivity type overlies, relative to the transistor top and bottom, a portion of the epitaxial base layer adjacent to the top surface of the epitaxial base layer. |
申请公布号 |
US2015108548(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201314059531 |
申请日期 |
2013.10.22 |
申请人 |
International Business Machines Corporation |
发明人 |
Dunn James S.;Liu Qizhi;Nakos James S. |
分类号 |
H01L29/737;H01L29/06;H01L29/66 |
主分类号 |
H01L29/737 |
代理机构 |
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代理人 |
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主权项 |
1. A bipolar transistor structure having a transistor top and a transistor bottom, said structure comprising:
a silicon substrate located at said transistor bottom and having a collector region of a first conductivity type; an epitaxial base layer of a second conductivity type overlying, relative to said transistor top and said transistor bottom, a portion of said collector region, said epitaxial base layer having a bottom surface on said silicon substrate and a top surface opposite said bottom surface,
a top region, relative to said transistor top and said transistor bottom, of said epitaxial base layer comprising a concentration of germanium having atomic compositions sufficient to avoid impacting transistor parameters, and sufficient to be resistant to selective chemical etching; and a silicon emitter layer of said first conductivity type overlying, relative to said transistor top and said transistor bottom, a portion of said epitaxial base layer adjacent said top surface of said epitaxial base layer. |
地址 |
Armonk NY US |