发明名称 SURFACE TREATMENT IN A DEP-ETCH-DEP PROCESS
摘要 <p>A method of forming semiconductor devices is provided. The method includes creating an opening in a semiconductor structure; depositing a first layer of metal inside the opening with the first layer of metal partially filling up the opening;modifying a top surface of the first layer of metal in an etching process; passivating the modified top surface of the first layer of metal to form a passivation layer; and depositing a second layer of metal directly on top of the passivation layer.</p>
申请公布号 WO2015055080(A1) 申请公布日期 2015.04.23
申请号 WO2014CN87658 申请日期 2014.09.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM (CHINA) CO., LIMITED 发明人 BAO, RUQIANG;FERRER, DOMINGO A.;PAPADATOS, FILIPPOS;STAMBAUGH, DANIEL P.
分类号 H01L21/768 主分类号 H01L21/768
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