<p>A method of forming semiconductor devices is provided. The method includes creating an opening in a semiconductor structure; depositing a first layer of metal inside the opening with the first layer of metal partially filling up the opening;modifying a top surface of the first layer of metal in an etching process; passivating the modified top surface of the first layer of metal to form a passivation layer; and depositing a second layer of metal directly on top of the passivation layer.</p>
申请公布号
WO2015055080(A1)
申请公布日期
2015.04.23
申请号
WO2014CN87658
申请日期
2014.09.28
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM (CHINA) CO., LIMITED
发明人
BAO, RUQIANG;FERRER, DOMINGO A.;PAPADATOS, FILIPPOS;STAMBAUGH, DANIEL P.