ELECTRONIC CIRCUIT HAVING SERIAL LATCH SCAN CHAINS

摘要

The invention relates to an electronic circuit (10) having one or more latch scan chains (12), the electronic circuit (10) comprising (i) a built-in test structure (14); (ii) generation means (16) for simultaneously generating scan-in data for each of said scan chains (12); (iii) interception means (18) for simultaneously intercepting test lines (20) of said scan chains (12), said test lines (20) comprising scan-in lines (22) and/or control lines (24). Said interception means (18) are responsive to said generation means (16) in order to simultaneously feed the generated scan-in data into each of said scan chains (12) for initializing the electronic circuit (10). The invention further relates to a method for initializing an electronic circuit (10), as well as a data processing system (210) for initializing an electronic circuit (10).

主权项

1. An electronic circuit coupled to one or more latch scan chains, the electronic circuit comprising:
a built-in test structure; a data circuit that provides scan-in data in parallel for each of the one or more latch scan chains; an interception circuit that intercepts test lines of the one or more latch scan chains simultaneously, wherein the test lines include at least one of a set including scan-in lines and control lines, and wherein the data generator circuit, responsive to a signal of the interception circuit, simultaneously feeds the scan-in data into each of the one or more latch scan chains to initialize the electronic circuit.