发明名称 METHOD PROVIDING AN EPITAXIAL PHOTONIC DEVICE HAVING A REDUCTION IN DEFECTS AND RESULTING STRUCTURE
摘要 A method of forming a photonic device and resulting structure are described in which the photonic device is epitaxially grown over a substrate surface vertically, and laterally over trench isolation regions formed in the substrate surface.
申请公布号 US2015108596(A1) 申请公布日期 2015.04.23
申请号 US201314055990 申请日期 2013.10.17
申请人 MICRON TECHNOLOGY, INC. 发明人 Meade Roy
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A photonic structure comprising: a semiconductor substrate comprising spaced trench isolation regions; an epitaxial photonic device formed over and in contact with the spaced trench isolation regions such that side edges of the photonic device extend over the spaced trench isolation regions.
地址 Boise ID US