发明名称 |
METHOD PROVIDING AN EPITAXIAL PHOTONIC DEVICE HAVING A REDUCTION IN DEFECTS AND RESULTING STRUCTURE |
摘要 |
A method of forming a photonic device and resulting structure are described in which the photonic device is epitaxially grown over a substrate surface vertically, and laterally over trench isolation regions formed in the substrate surface. |
申请公布号 |
US2015108596(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201314055990 |
申请日期 |
2013.10.17 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
Meade Roy |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A photonic structure comprising:
a semiconductor substrate comprising spaced trench isolation regions; an epitaxial photonic device formed over and in contact with the spaced trench isolation regions such that side edges of the photonic device extend over the spaced trench isolation regions. |
地址 |
Boise ID US |