发明名称 Method of manufacturing quantum dots in a semiconductor device
摘要 <p>The method of manufacturing the semiconductor device comprises the step of forming quantum dots 16 on a base layer 10 by self-assembled growth; the step of irradiating Sb or GaSb to the surface of the base layer 10 before or in the step of forming quantum dots 16; the step of etching the surfaces of the quantum dots 16 with an As raw material gas to thereby remove an InSb layer 18 containing Sb deposited on the surfaces of the quantum dots 16; and growing a capping layer 22 on the quantum dots 16 with the InSb layer 18 removed.</p>
申请公布号 EP1858084(B1) 申请公布日期 2015.04.22
申请号 EP20070108221 申请日期 2007.05.15
申请人 FUJITSU LTD.;THE UNIVERSITY OF TOKYO 发明人 ARAKAWA, YASUHIKO;GUIMARD, DENIS;TSUKAMOTO, SHIRO;EBE, HIROJI;SUGAWARA, MITSURU
分类号 H01L29/12;H01L21/20 主分类号 H01L29/12
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