发明名称 半導体装置の樹脂バリ除去方法
摘要 PROBLEM TO BE SOLVED: To provide a resin burr removing method of a semiconductor device capable of economically manufacturing products having a good quality in a shorter time than that in the past.SOLUTION: In a method of removing a resin burr 13 adhered to the rear surface of a die pad 10 from a semiconductor device 12 in which the die pad 10 is exposed on the rear surface of a package 11, the rear surface side of the die pad 10 to which the resin burr 13 is adhered is irradiated with a laser, the resin burr 13 is removed by electrolytic degreasing after carbonizing the resin burr 13. The irradiation range of the laser is 80% or more and 120% or less of the size of the die pad 10.
申请公布号 JP5706128(B2) 申请公布日期 2015.04.22
申请号 JP20100238786 申请日期 2010.10.25
申请人 株式会社三井ハイテック 发明人 永杉 茂;三井 政徳
分类号 H01L21/56 主分类号 H01L21/56
代理机构 代理人
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