发明名称 質量分光分析におけるサンプル導入のための開放型プローブ方法および装置
摘要 <p>An open probe method for sample introduction into a mass spectrometer is disclosed, comprising the steps of: loading a sample holder with sample compounds to be analyzed; heating a probe oven; introducing said sample compounds in said sample holder into said heated probe oven; flowing inert gas into said heated probe oven; vaporizing said sample in said heated probe oven by the combined effect of oven temperature and inert gas flow; entraining said vaporized sample in said inert gas; and, transferring said vaporized sample in inert gas into an ion source of a mass spectrometer; wherein said heated probe oven remains open to the ambient atmosphere during sample introduction and analysis; said inert gas is flowing in said heated probe oven in two directions of a transfer line to a mass spectrometer ion source and to the oven opening; said vaporized sample in inert gas is transferred through a heated transfer line directly into the ionization chamber of an ion source of a mass spectrometer. An apparatus for this method of sample introduction is also disclosed. The primary advantage of this method and apparatus is that the heated probe oven remains open to the ambient atmosphere during sample introduction and analysis thereby enabling faster sample analysis.</p>
申请公布号 JP5705421(B2) 申请公布日期 2015.04.22
申请号 JP20090162366 申请日期 2009.07.09
申请人 发明人
分类号 G01N27/62;G01N27/64;H01J49/04 主分类号 G01N27/62
代理机构 代理人
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