发明名称 X線異物検出装置
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray foreign substance detection apparatus which is capable of reducing a difference in size of an object to be examined on two X-ray images to such a degree that reduction of a foreign substance detection performance becomes ignorable. <P>SOLUTION: An X-ray foreign substance detection apparatus comprises a support mechanism 71, an adjustment determination unit 81 and a display 5. The support mechanism 71 supports an X-ray tube 32 so as to adjust the position on a perpendicular axis. In the adjustment determination unit 81, a first waveform that is a waveform in a width direction of an object W to be examined in first X-ray image data and a second waveform that is a waveform in the width direction of the object W to be examined in second X-ray image data are acquired and compared and in the case where a width of the second waveform is larger than that of the first waveform, it is determined that an adjusting direction of the X-ray tube 32 is upward in the vertical axis but in the case where the width of the second waveform is smaller than that of the first waveform, it is determined that the adjusting direction of the X-ray tube 32 is downward in the vertical axis. The display 5 displays thereon the adjusting direction determined by the adjustment determination unit 81. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5706723(B2) 申请公布日期 2015.04.22
申请号 JP20110059128 申请日期 2011.03.17
申请人 发明人
分类号 G01N23/087;G01N23/04;G01N23/18 主分类号 G01N23/087
代理机构 代理人
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