发明名称 イオントラップ質量分析器
摘要 <p>An ion trap mass analyzer includes an elongated tunnel that has a wall, a longitudinal axis and an inner space. The wall includes a substrate and conductor trace patterns. There is also a variable electric potential means for providing electric potentials which is connected to the conductor trace patterns. The conductor trace patterns and the variable electric potential means provide a variable electric field within the inner space of the tunnel for transferring, storing, and analyzing ions.</p>
申请公布号 JP5706548(B2) 申请公布日期 2015.04.22
申请号 JP20140003318 申请日期 2014.01.10
申请人 发明人
分类号 H01J49/42;G01N30/72;H01J49/06;H01J49/26 主分类号 H01J49/42
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