Semiconductor device, method for inspecting the same, and method for driving the same

摘要

A method for limiting writing of data to a specific memory cell without disconnecting a wiring of a memory cell array or placing a prober in contact with a memory cell, a row, or a column is provided. Row address data and column address data of a memory cell to which data cannot be written are stored in a register. Enable data which controls data writing is stored in the register. Next, in order to write data to a memory cell, row address data and column address data of a memory cell to which data is written, writing enable data, and the like are output from a logic circuit; thus, writing of data to a memory cell corresponding to the address data stored in the register is inhibited.

主权项

1. A method for inspecting a semiconductor device comprising the steps of:
storing address data, of a memory cell in which data writing is inhibited, into a register; comparing an output of the register with an output of a main logic circuit in a writing inhibit circuit, and then outputting a signal, thereby inspecting a redundant function; and replacing the memory cell with a redundant memory cell in the case where writing data to the memory cell has failed, wherein signals inputted to the register include writing inhibit enable data, writing inhibit column address data, and writing inhibit row address data.