发明名称 Nonvolatile semiconductor storage device and method of manufacturing the same
摘要 A nonvolatile semiconductor storage device includes a semiconductor substrate; a first insulating film disposed above the semiconductor substrate; a first electrode film disposed above the first insulating film; a second insulating film disposed above the first electrode film; a second electrode film disposed above the second insulating film; a third electrode film filling a first trench and overlying the second electrode film, the first trench having a first width and a first depth and extending through the second electrode film and the second insulating film and into the first electrode film; and a first barrier metal film and a first metal film disposed above the third electrode film; wherein the third electrode film above the second electrode film has a first thickness equal to or less than ½ of the first width of the first trench.
申请公布号 US9012972(B2) 申请公布日期 2015.04.21
申请号 US201314019844 申请日期 2013.09.06
申请人 Kabushiki Kaisha Toshiba 发明人 Matsumori Hisakazu;Takekida Hideto;Mino Akira;Murakami Jun
分类号 H01L29/788;H01L29/423;H01L29/40;H01L21/28;H01L27/115;H01L29/66 主分类号 H01L29/788
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A nonvolatile semiconductor storage device comprising: a semiconductor substrate; a first insulating film disposed above the semiconductor substrate; a first electrode film disposed above the first insulating film; a second insulating film disposed above the first electrode film; a second electrode film disposed above the second insulating film; a third electrode film filling a first trench and overlying the second electrode film, and the first trench having a first width and a first depth and extending through the second electrode film and the second insulating film and into the first electrode film; and a first barrier metal film and a first metal film formed in the listed sequence above the third electrode film; wherein the third electrode film above the second electrode film has a first thickness equal to or less than ½ of the first width of the first trench.
地址 Minato-ku JP