发明名称 |
Nonvolatile semiconductor storage device and method of manufacturing the same |
摘要 |
A nonvolatile semiconductor storage device includes a semiconductor substrate; a first insulating film disposed above the semiconductor substrate; a first electrode film disposed above the first insulating film; a second insulating film disposed above the first electrode film; a second electrode film disposed above the second insulating film; a third electrode film filling a first trench and overlying the second electrode film, the first trench having a first width and a first depth and extending through the second electrode film and the second insulating film and into the first electrode film; and a first barrier metal film and a first metal film disposed above the third electrode film; wherein the third electrode film above the second electrode film has a first thickness equal to or less than ½ of the first width of the first trench. |
申请公布号 |
US9012972(B2) |
申请公布日期 |
2015.04.21 |
申请号 |
US201314019844 |
申请日期 |
2013.09.06 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Matsumori Hisakazu;Takekida Hideto;Mino Akira;Murakami Jun |
分类号 |
H01L29/788;H01L29/423;H01L29/40;H01L21/28;H01L27/115;H01L29/66 |
主分类号 |
H01L29/788 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A nonvolatile semiconductor storage device comprising:
a semiconductor substrate; a first insulating film disposed above the semiconductor substrate; a first electrode film disposed above the first insulating film; a second insulating film disposed above the first electrode film; a second electrode film disposed above the second insulating film; a third electrode film filling a first trench and overlying the second electrode film, and the first trench having a first width and a first depth and extending through the second electrode film and the second insulating film and into the first electrode film; and a first barrier metal film and a first metal film formed in the listed sequence above the third electrode film; wherein the third electrode film above the second electrode film has a first thickness equal to or less than ½ of the first width of the first trench. |
地址 |
Minato-ku JP |