Spectrum detector including a photodector having a concavo-convex patten

摘要

Provided is a spectrum detector capable of being miniaturized and which does not require complicated optical axis alignment. The spectrum detector of the present invention comprises: a substrate; a photodetector formed on the substrate and including a semiconductor having a plurality of convex portions; and a wavelength detection circuit for detecting a wavelength of light transmitted through the plurality of convex portions, from light incident on the photodetector. According to the present invention, a small-sized spectrum detector can be provided which can easily detect a peak wavelength distribution included in light of an unknown wavelength, without the use of optical equipment such as a grating or prism, thus dispensing with the need for the optical axis alignment of a complex optical system.

主权项

1. A method of detecting a spectrum of light, the method comprising:
absorbing light incident on a plurality of photodetectors arranged on a substrate, wherein each photodetector comprises a semiconductor having a plurality of convex portions, the convex portions being different from one another with respect to at least one of size, pitch, and height, and detecting a wavelength of light transmitted through the plurality of convex portions of each photodetector using a wavelength detection circuit, wherein detecting the wavelength of light comprises:
measuring the optical voltages respectively outputted from the plurality of photodetectors using an optical voltage measurement circuit and outputting an optical voltage measurement signal;recording a plurality of reference optical voltage measurement results and a plurality of reference potential difference results respectively corresponding to the plurality of photodetectors using a memory;extracting a waveform of a comparison object from the optical voltage measurement signal and a reference optical voltage measurement signal using a waveform extraction circuit;calculating a potential difference of the waveform using a potential difference calculation circuit and outputting a measurement potential difference; andcomparing the measurement potential difference with the plurality of reference potential difference results using a comparison circuit and detecting a peak wavelength included in the incident light.