发明名称 |
Method for conformal treatment of dielectric films using inductively coupled plasma |
摘要 |
Disclosed are apparatus and methods for processing a substrate. The substrate having a feature with a layer thereon is exposed to an inductively coupled plasma which forms a substantially conformal layer. |
申请公布号 |
US9012336(B2) |
申请公布日期 |
2015.04.21 |
申请号 |
US201313858922 |
申请日期 |
2013.04.08 |
申请人 |
Applied Materials, Inc. |
发明人 |
Pan Heng;Rogers Matthew Scott;Swenberg Johanes F.;Olsen Christopher S.;Liu Wei;Chu David;Bevan Malcom J. |
分类号 |
H01L21/469;H01L21/31;H01L21/02 |
主分类号 |
H01L21/469 |
代理机构 |
Servilla Whitney LLC |
代理人 |
Servilla Whitney LLC |
主权项 |
1. A method of forming a film, the method comprising:
placing a substrate on a substrate support of a processing chamber, the substrate having a first layer thereon comprising a structure including at least one sidewall, the substrate having a film comprising an oxide deposited on the at least one sidewall of the structure; and exposing the film to an inductively coupled plasma formed from a process gas comprising one or more of oxygen and an oxygen-containing gas and oxygen-inert gas mixture to form a substantially conformal film. |
地址 |
Santa Clara CA US |