发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can reduce contact resistance between a substrate and an electrode without leaving a damage on a gallium nitride substrate, which is caused by a surface treatment on the gallium nitride substrate.SOLUTION: A manufacturing method of a semiconductor device having a substrate 5 composed of gallium nitride and an electrode 7 forming ohmic contact with the substrate 5, in which the substrate 5 has a gallium polar face and a nitrogen polar face opposite to the gallium polar face comprises: a process of performing wet etching using hydrochloric acid on the nitrogen polar face; and a process of laminating metal to be the electrode 7 on the wet etched nitrogen polar face. |
申请公布号 |
JP2015076506(A) |
申请公布日期 |
2015.04.20 |
申请号 |
JP20130211727 |
申请日期 |
2013.10.09 |
申请人 |
NISSAN MOTOR CO LTD |
发明人 |
MARUI TOSHIHARU;HAYASHI TETSUYA;GEI AKIRA;EMORI KENTA;SAITO YUJI |
分类号 |
H01L21/28;H01L21/306;H01L21/329;H01L29/06;H01L29/41;H01L29/861;H01L29/868;H01L33/16;H01L33/22;H01L33/32;H01L33/36 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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