发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can reduce contact resistance between a substrate and an electrode without leaving a damage on a gallium nitride substrate, which is caused by a surface treatment on the gallium nitride substrate.SOLUTION: A manufacturing method of a semiconductor device having a substrate 5 composed of gallium nitride and an electrode 7 forming ohmic contact with the substrate 5, in which the substrate 5 has a gallium polar face and a nitrogen polar face opposite to the gallium polar face comprises: a process of performing wet etching using hydrochloric acid on the nitrogen polar face; and a process of laminating metal to be the electrode 7 on the wet etched nitrogen polar face.
申请公布号 JP2015076506(A) 申请公布日期 2015.04.20
申请号 JP20130211727 申请日期 2013.10.09
申请人 NISSAN MOTOR CO LTD 发明人 MARUI TOSHIHARU;HAYASHI TETSUYA;GEI AKIRA;EMORI KENTA;SAITO YUJI
分类号 H01L21/28;H01L21/306;H01L21/329;H01L29/06;H01L29/41;H01L29/861;H01L29/868;H01L33/16;H01L33/22;H01L33/32;H01L33/36 主分类号 H01L21/28
代理机构 代理人
主权项
地址