发明名称 APPEARANCE INSPECTION SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide an appearance inspection system which reduces omission and oversight due to visual inspection to be able to perform appearance inspection with high reliability and high inspection work efficiency without performing complicated initialization.SOLUTION: The appearance inspection system includes: imaging prescribed inspection points of a non-defective product as a reference of an inspection object by imaging means to display reference image data on display means; storing points to be automatically inspected and points to be visually inspected in the reference image data, into storage means after a sampling step of dividing the inspection points into the points to be automatically inspected and the points to be visually inspected; imaging prescribed inspection points of the inspection object by the imaging means; causing automatic inspection means to execute processing of determining whether the points to be automatically inspected in an obtained captured image are good or not by comparison with the reference image data; visually determining whether the points to be visually inspected in the captured image are good or not; performing input indicative of the presence of a defect, to each point determined to be defective; and performing input indicative of the absence of a defect, to each point determined to be non-defective.</p>
申请公布号 JP2015075412(A) 申请公布日期 2015.04.20
申请号 JP20130212447 申请日期 2013.10.10
申请人 FUJI ELECTRONICS KK 发明人 MANO AKIRA
分类号 G01N21/84;G01B11/30;G01N21/956;H05K3/34 主分类号 G01N21/84
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