发明名称 Method of manufacturing multilayer thin film and magnetic tunnel junction structure including the multilayer thin film
摘要 <p>Provided are a method for producing a multilayer thin film and an MTJ structure including the multilayer thin film produced thereby. The method for producing a multilayer thin film comprises the steps of: forming, on a substrate, a crystallization assisting layer including an oxide-based material layer including an oxide-based material of which a main element is a first ferromagnetic material; forming the multilayer thin film including a second ferromagnetic material on the crystallization assisting layer; and heating the multilayer thin film formed on the crystallization assisting layer to crystallize the multilayer thin film. Accordingly, a method for producing a multilayer thin film having high perpendicular magnetic anisotropy by means of heating temperature used in an actual memory device process can be provided.</p>
申请公布号 KR20150042014(A) 申请公布日期 2015.04.20
申请号 KR20130120702 申请日期 2013.10.10
申请人 发明人
分类号 G11C11/15 主分类号 G11C11/15
代理机构 代理人
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