| 摘要 |
FIELD: measurement equipment.SUBSTANCE: according to the proposed method, under spectrometric measurement of average temperature of gas layer of specified thickness, containing an absorber, they measure spectrum of radiation from gas layer of specified thickness. Partial pressure of absorber is measured, at least in two cross sections of gas layer of specified thickness in direction of the measurement line of radiation spectrum. By averaged value of partial pressure they decide on distribution of the absorber in the gas layer of specified thickness. They calculate dependence of absorber wave number W in the gas layer of specified thickness on gas temperature W=f(T). The average temperature of gas layer of specified thickness is determined by the point of crossing of the line that reflects dependence of absorber wave number in the gas layer of specified thickness on gas temperature in the system of coordinates mV and T, with the line produced as a result of measurements of the radiation spectrum of the gas layer of specified thickness in the system of coordinates mV and T.EFFECT: increased accuracy of detection of average temperature of gas layer of specified thickness.2 cl, 6 dwg |
