发明名称 X-RAY FOREIGN OBJECT INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an X-ray foreign object inspection apparatus which can clearly display shapes of foreign objects in objects under inspection being conveyed on a conveying path by acquiring radioscopic images viewed from an oblique angle.SOLUTION: Shoes under inspection are irradiated with fan-beam X-rays 1 from an X-ray source 30, and the X-rays that passes through the shoes are detected by an X-ray detector to obtain a radioscopic image. The X-ray source 30 and the X-ray detector are positioned to have a conveying path in between. The X-ray source 30 is set up such that an X-ray central plane 1a that cuts through a center point of the fan-beam X-rays 1 in a thickness direction thereof intersects with a conveyor reference plane 23a on the conveying path at an angle. The X-ray detector comprises a plurality of X-ray line sensors which are positioned along an L-shaped reference line A such that all of many X-ray detection elements (of each X-ray line sensors) intersect with the X-ray central plane 1a of the fan-beam X-rays 1.
申请公布号 JP2015075341(A) 申请公布日期 2015.04.20
申请号 JP20130209781 申请日期 2013.10.07
申请人 RIGAKU CORP 发明人 KODAMA YUICHI
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
主权项
地址