发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device using an oxide semiconductor having stable electric characteristics.SOLUTION: By a halogen element typified by fluorine or chlorine, impurities such as hydrogen and moisture (hydrogen atoms, or a chemical compound containing hydrogen atoms such as HO) contained in an oxide semiconductor layer are removed from the oxide semiconductor layer, and concentration of the impurities in the oxide semiconductor layer is reduced. The halogen element can be included in a gate insulating layer and/or an insulating layer provided in contact with the oxide semiconductor layer to form the gate insulating layer and/or the insulating layer, or the halogen element may be attached to the oxide semiconductor layer by plasma treatment under a gas atmosphere containing the halogen element.
申请公布号 JP2015073113(A) 申请公布日期 2015.04.16
申请号 JP20140234201 申请日期 2014.11.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;SUZUKI KUNIHIKO;TAKAHASHI MASAHIRO
分类号 H01L21/336;G02F1/1368;H01L21/822;H01L27/04;H01L29/786;H01L51/50;H05B33/14 主分类号 H01L21/336
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