发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 This semiconductor memory device comprises a memory cell array that includes: a plurality of first lines; a plurality of second lines intersecting the plurality of first lines; a plurality of memory cells each disposed at an intersection of the plurality of first lines and the plurality of second lines and including a variable resistance element; and a select transistor respectively connected to an end of the plurality of first lines. The select transistor includes a gate electrode, a gate insulating film, and a conductive layer. Moreover, one end of that conductive layer is connected to the end of the first line, and a non-linear resistance layer configured from a non-linear material is connected between the first line and the conductive layer.
申请公布号 US2015103582(A1) 申请公布日期 2015.04.16
申请号 US201414178636 申请日期 2014.02.12
申请人 Kabushiki Kaisha Toshiba 发明人 OKAWA Takamasa;TSUKAMOTO Takayuki;MINEMURA Yoichi;KANNO Hiroshi;YOSHIDA Atsushi;TABATA Hideyuki
分类号 H01L27/24;G11C13/00;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a memory cell array including: first line; second lines intersecting the first line; memory cells disposed at an intersection of the first line and the second lines and including a variable resistance element; and a select transistor respectively connected to an end of the first line, the selector including a gate electrode, a gate insulating film, and a semiconductor layer, one end of the semiconductor layer being connected to the end of the first line, and a non-linear resistance layer disposed between the first line and the semiconductor layer, the non-linear resistance layer being configured from a non-linear material.
地址 Minato-ku JP