发明名称 |
METHODS OF MEASURING A CHARACTERISTIC OF A CREPING ADHESIVE FILM AND METHODS OF MODIFYING THE CREPING ADHESIVE FILM |
摘要 |
Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film. |
申请公布号 |
US2015101410(A1) |
申请公布日期 |
2015.04.16 |
申请号 |
US201414575216 |
申请日期 |
2014.12.18 |
申请人 |
Kemira Oyj |
发明人 |
Grigoriev Vladimir;Nguyen Danny;Rosencrance Scott;Lu Chen |
分类号 |
G01H13/00 |
主分类号 |
G01H13/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of measuring a characteristic of a creping adhesive film disposed on a dryer, comprising:
disposing a creping adhesive film on a sensor substrate; measuring an oscillation frequency of the sensor substrate having the creping adhesive film disposed thereon using a Quartz Crystal Microbalance (QCM) technique; and determining a characteristic of the creping adhesive film. |
地址 |
Helsinki FI |