发明名称 METHODS OF MEASURING A CHARACTERISTIC OF A CREPING ADHESIVE FILM AND METHODS OF MODIFYING THE CREPING ADHESIVE FILM
摘要 Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.
申请公布号 US2015101410(A1) 申请公布日期 2015.04.16
申请号 US201414575216 申请日期 2014.12.18
申请人 Kemira Oyj 发明人 Grigoriev Vladimir;Nguyen Danny;Rosencrance Scott;Lu Chen
分类号 G01H13/00 主分类号 G01H13/00
代理机构 代理人
主权项 1. A method of measuring a characteristic of a creping adhesive film disposed on a dryer, comprising: disposing a creping adhesive film on a sensor substrate; measuring an oscillation frequency of the sensor substrate having the creping adhesive film disposed thereon using a Quartz Crystal Microbalance (QCM) technique; and determining a characteristic of the creping adhesive film.
地址 Helsinki FI