发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a charged particle beam device mounting an aberration corrector composed of a multipole, including means for suppressing the impact on aberration correction by cancelling an external magnetic field approaching the aberration corrector and a noise due to a mirror body current.SOLUTION: In a charged particle beam device, a multipole has a multipole for controlling the aberration of a charged particle beam, a shield provided to cover the multipole, a magnetic field sensor arranged in the shield with a gap above the axis of the multipole, and detecting the magnetic field in the direction of the pole, and a cancel coil for cancelling the impact of a time-variant magnetic field on the multipole on the basis of detection signal from the magnetic sensor.</p>
申请公布号 JP2015072843(A) 申请公布日期 2015.04.16
申请号 JP20130208716 申请日期 2013.10.04
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKANO TOMONORI;HIROSE KOTOKO
分类号 H01J37/09;H01J37/153 主分类号 H01J37/09
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