| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a device for generating a high temperature gradient in a nuclear duel sample.SOLUTION: An assembly comprising a sample 100 and a device for generating a high temperature gradient in the sample 100 is provided that includes: a chamber 20 inside which the sample is placed; a resistor 60 passing through the sample; first inductive means which is provided at the periphery of the chamber and creates an electromagnetic field; and second inductive means which is disposed inside the chamber 20, is connected to the resistor 60 and is capable of picking up the electromagnetic field in order to cause an induced current to flow through the resistor. The chamber 20 is transparent, and the first inductive means includes at least one first coil 31 at least one coil of which includes windings separated by at least 2 mm, and this separation is configured to allow optical means for measuring deformation to be targeted.</p> |
