| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a control device of a test device and a control method of a test device that can respond immediately to a change in a state of a test piece and the like with a shorter correction time.SOLUTION: A waveform correction calculation part 24 is provided that comprises a harmonic calculation part 26 for performing calculation processing of a fundamental wave component and an arbitrary n-fold harmonic of a response waveform from a test device to a control waveform input to the test device, a high frequency generation part 28 for performing calculation processing of a phase and amplitude of the arbitrary n-fold harmonic calculated by the harmonic calculation part 26, and an addition part 30 for inputting and aggregating the phase and amplitude of the arbitrary n-fold harmonic calculated by the high frequency generation part 28 and the fundamental wave component, and generating a control waveform to the test device.</p> |
