发明名称 ポジ型レジスト組成物、レジストパターン形成方法
摘要 PROBLEM TO BE SOLVED: To provide a positive resist composition excellent in lithographic characteristics and pattern features and capable of reducing defects, and to provide a method for forming a resist pattern using the positive resist composition.SOLUTION: The positive resist composition includes: a base component (A) the solubility of which with an alkali developing solution is increased by an action of an acid; and an acid generator component (B) generating an acid by exposure. The base component (A) includes a resin component (A1) having a structural unit (a0-1) expressed by formula (a0-1) and a structural unit (a0-2) expressed by formula (a0-2).
申请公布号 JP5703172(B2) 申请公布日期 2015.04.15
申请号 JP20110187621 申请日期 2011.08.30
申请人 東京応化工業株式会社 发明人 鈴木 祐輔;山田 知孝
分类号 G03F7/039;C08F220/38;G03F7/004 主分类号 G03F7/039
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