| 摘要 |
<p>The invention relates to a measuring apparatus comprising a transmitter unit (10, 42) for generating an electromagnetic measuring field (12) which penetrates a wall (18), a receiver unit (14) for detecting at least one portion of the measuring field (12), and an evaluation unit (16) for evaluating a signal (20) detected by the receiver unit (14). The evaluation unit (16) is configured so as to determine at least one parameter (t<SUB>1</SUB>-t<SUB>3</SUB>, t<SUB>12</SUB>, t<SUB>13</SUB>) for a local dependence of the measuring field (12) along the wall (18) and determine a wall (18) thickness (D) in accordance with said parameter (t<SUB>1</SUB>-t<SUB>3</SUB>, t<SUB>12</SUB>, t<SUB>13</SUB>).</p> |
