发明名称 半導体装置の作製方法
摘要 <p><P>PROBLEM TO BE SOLVED: To integrate a semiconductor device having n-channel type transistors to p-channel type transistors, to improve performance of the semiconductor device, and to reduce cost of the semiconductor device having a large area, in a creating method of the semiconductor device. <P>SOLUTION: The creating method of the semiconductor device includes a process wherein accelerated ions are radiated onto its single-crystal silicon substrate having a plane within±15°from a ä211} plane as its surface, and thereby, a brittle region is formed in its single-crystal silicon substrate. Also, the creating method includes a process wherein the single-crystal silicon substrate and a base substrate are bonded to each other via an insulating layer, a process wherein the single-crystal silicon substrate is separated in the brittle region, and a single-crystal silicon layer having the plane within±15°from the ä211} plane as its surface is formed on the base substrate and a process wherein by using the single-crystal silicon layer, the n-channel type and p-channel type transistors having their channel length directions within±15°from a <111> axis are formed. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP5700621(B2) 申请公布日期 2015.04.15
申请号 JP20100094708 申请日期 2010.04.16
申请人 发明人
分类号 H01L27/12;H01L21/02;H01L21/336;H01L29/786 主分类号 H01L27/12
代理机构 代理人
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