发明名称 |
DUAL MODE SMALL ANGLE SCATTERING CAMERA |
摘要 |
A system for analyzing a sample is provided. The system includes a beam selection device for selecting between a one-dimensional operation mode for providing a one-dimensional x-ray beam to the sample and a two-dimensional operation mode for providing a two-dimensional x-ray beam to the sample. |
申请公布号 |
EP2859335(A1) |
申请公布日期 |
2015.04.15 |
申请号 |
EP20130732302 |
申请日期 |
2013.06.07 |
申请人 |
RIGAKU INNOVATIVE TECHNOLOGIES, INC. |
发明人 |
JIANG, LICAI |
分类号 |
G01N23/201 |
主分类号 |
G01N23/201 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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