发明名称 Distributed on-chip decoupling apparatus and method using package interconnect
摘要 An integrated circuit device is disclosed. The integrated circuit device includes a semiconductor die fabricated by a front-end semiconductor process and having oppositely disposed planar surfaces. The semiconductor die is formed with semiconductor devices, power supply circuitry coupled to the semiconductor devices, decoupling capacitance circuitry, and through-vias. The through-vias include a first group of vias coupled to the power supply circuitry and a second group of vias coupled to the decoupling capacitance circuitry. Conductors are formed in a first metal layer disposed on the semiconductor die in accordance with a back-end semiconductor process. The conductors are configured to couple to the first and second groups of through-vias to establish conductive paths from the power supply circuitry to the decoupling capacitance circuitry.
申请公布号 US9006907(B2) 申请公布日期 2015.04.14
申请号 US201313903323 申请日期 2013.05.28
申请人 Rambus Inc. 发明人 Secker David;Yang Ling;Tran Chanh;Ji Ying
分类号 H01L23/48;H01L21/768;H01L23/528;H01L25/18;H01L23/522;H01L23/498 主分类号 H01L23/48
代理机构 Peninsula Patent Group 代理人 Kreisman Lance M.;Peninsula Patent Group
主权项 1. A semiconductor device comprising: an integrated circuit memory device including a semiconductor memory die formed with a first group of storage circuits, the first group of storage circuits distributed across the semiconductor memory die in a first spaced-apart pattern; and an integrated circuit memory controller stacked with the integrated circuit memory device, the integrated circuit memory controller including a semiconductor controller die formed with a first group of interface circuits distributed across the semiconductor controller die in a second pattern that substantially aligns with the first group of storage circuits, the semiconductor controller die formed with a third circuit separate from the first group of interface circuits and a first group of through-vias that couple to the first group of interface circuits, and to the third circuit,back-end metal formed on the semiconductor controller die to electrically contact the through-vias to complete one or more conductive paths that couple the second group of interface circuits to the third circuit.
地址 Sunnyvale CA US