发明名称 |
Semiconductor structures and devices |
摘要 |
Methods of forming semiconductor structures that include bodies of a semiconductor material disposed between rails of a dielectric material are disclosed. Such methods may include filling a plurality of trenches in a substrate with a dielectric material and removing portions of the substrate between the dielectric material to form a plurality of openings. In some embodiments, portions of the substrate may be undercut to form a continuous void underlying the bodies and the continuous void may be filled with a conductive material. In other embodiments, portions of the substrate exposed within the openings may be converted to a silicide material to form a conductive material under the bodies. For example, the conductive material may be used as a conductive line to electrically interconnect memory device components. Semiconductor structures and devices formed by such methods are also disclosed. |
申请公布号 |
US9006859(B2) |
申请公布日期 |
2015.04.14 |
申请号 |
US201314034014 |
申请日期 |
2013.09.23 |
申请人 |
Micron Technology, Inc. |
发明人 |
Wells David H.;Sandhu Gurtej S. |
分类号 |
H01L29/06;H01L23/535;H01L21/84;H01L21/74;H01L45/00;H01L27/102;H01L27/12;H01L27/24;H01L21/761 |
主分类号 |
H01L29/06 |
代理机构 |
TraskBritt |
代理人 |
TraskBritt |
主权项 |
1. A semiconductor structure, comprising:
rails of dielectric material protruding above a substrate; and discrete regions of semiconductor material suspended between adjacent rails of the dielectric material, the discrete regions of semiconductor material separated from the substrate by a continuous void extending in a first direction parallel to the rails of dielectric material and in a second direction from a first rail of adjacent rails of the dielectric material to a second rail of adjacent rails of the dielectric material. |
地址 |
Boise ID US |