发明名称 Semiconductor structures and devices
摘要 Methods of forming semiconductor structures that include bodies of a semiconductor material disposed between rails of a dielectric material are disclosed. Such methods may include filling a plurality of trenches in a substrate with a dielectric material and removing portions of the substrate between the dielectric material to form a plurality of openings. In some embodiments, portions of the substrate may be undercut to form a continuous void underlying the bodies and the continuous void may be filled with a conductive material. In other embodiments, portions of the substrate exposed within the openings may be converted to a silicide material to form a conductive material under the bodies. For example, the conductive material may be used as a conductive line to electrically interconnect memory device components. Semiconductor structures and devices formed by such methods are also disclosed.
申请公布号 US9006859(B2) 申请公布日期 2015.04.14
申请号 US201314034014 申请日期 2013.09.23
申请人 Micron Technology, Inc. 发明人 Wells David H.;Sandhu Gurtej S.
分类号 H01L29/06;H01L23/535;H01L21/84;H01L21/74;H01L45/00;H01L27/102;H01L27/12;H01L27/24;H01L21/761 主分类号 H01L29/06
代理机构 TraskBritt 代理人 TraskBritt
主权项 1. A semiconductor structure, comprising: rails of dielectric material protruding above a substrate; and discrete regions of semiconductor material suspended between adjacent rails of the dielectric material, the discrete regions of semiconductor material separated from the substrate by a continuous void extending in a first direction parallel to the rails of dielectric material and in a second direction from a first rail of adjacent rails of the dielectric material to a second rail of adjacent rails of the dielectric material.
地址 Boise ID US