Built-in self test for silicon photonics device

摘要

In an example, the present invention includes an integrated system on chip device. The device has a self test block configured on the silicon photonics device and to be operable during a test operation, the self test block comprising a broad band source configured to emit electromagnetic radiation from 1200 nm to 1400 nm or 1500 to 1600 nm to a multiplexer device. In an example, a self test output is configured to a spectrum analyzer device external to the silicon photonics device.

主权项

1. A monolithically integrated system on chip device, the device comprising:
a single silicon substrate member; a data input/output interface provided on the substrate member and configured for a predefined data rate and protocol; an input/output block provided on the substrate member and coupled to the data input/output interface, the input/output block comprising a SerDes block, a CDR block, a compensation block, and an equalizer block; a signal processing block provided on the substrate member and coupled to the input/output block, the signal processing block configured to the input/output block using a bi-direction bus in an intermediary protocol; a driver module provided on the substrate member and coupled to the signal processing block, the driver module coupled to the signal processing blocking using a uni-directional multi-lane bus; a driver interface provided on the substrate member and coupled to the driver module and configured to be coupled to a silicon photonics device, the driver interface being configured to transmit output data in either an amplitude modulation format or a combination of phase/amplitude modulation format or a phase modulation format; a receiver module comprising a TIA block provided on the substrate member and to be coupled to the silicon photonics device using predefined modulation format, and configured to the signal processing block to communicate information to the input/output block for transmission through the data input/output interface; a communication block provided on the substrate member and operably coupled to the input/output block, the signal processing block, the driver block, and the receiver block; a communication interface coupled to the communication block; and a control block provided on the substrate member and coupled to the communication block; a self test block configured on the silicon photonics device and to be operable during a test operation, the self test block comprising a broadband source configured to emit electromagnetic radiation from 1200 nm to 1400 nm or 1500 to 1600 nm to a multiplexer device; and a self test output configured to a spectrum analyzer device external to the silicon photonics device.