发明名称 |
Global quantitative characterization of patterns using fractal analysis |
摘要 |
Various systems, methods, and programs embodied in computer-readable mediums are provided for the global quantitative characterization of patterns. In one representative embodiment, a method is provided in which fractal analysis is performed on a pattern to generate a global quantitative characterization of the pattern in a computer system. |
申请公布号 |
US9008452(B2) |
申请公布日期 |
2015.04.14 |
申请号 |
US200611559660 |
申请日期 |
2006.11.14 |
申请人 |
West Virginia University |
发明人 |
Jaffe Charles;Stiller Alfred H. |
分类号 |
G06K9/36;G06K9/52;G06K9/00 |
主分类号 |
G06K9/36 |
代理机构 |
Thomas | Horstemeyer, LLP. |
代理人 |
Thomas | Horstemeyer, LLP. |
主权项 |
1. A method for characterization of patterns, comprising the steps of:
obtaining, in a computer system, a pattern; performing, in the computer system, a fractal analysis on the pattern; and generating, in the computer system, a global quantitative characterization of the pattern based at least in part upon a fractal, where the global quantitative characterization of the pattern comprises at least one scaling parameter associated with a gradation of the fractal, the at least one scaling parameter expressing a ratio of a number of points in a portion of the fractal that is approximately similar to the entire fractal relative to a total number of points in the fractal. |
地址 |
Morgantown WV US |