发明名称 |
Method of manufacturing a semiconductor device with a carrier having a cavity and semiconductor device |
摘要 |
A method includes providing a carrier having a first cavity, providing a dielectric foil with a metal layer attached to the dielectric foil, placing a first semiconductor chip in the first cavity of the carrier, and applying the dielectric foil to the carrier. |
申请公布号 |
US9006873(B2) |
申请公布日期 |
2015.04.14 |
申请号 |
US201313944595 |
申请日期 |
2013.07.17 |
申请人 |
Infineon Technologies AG |
发明人 |
Nikitin Ivan;Mahler Joachim |
分类号 |
H01L23/495;H01L23/34;H01L23/498;H01L23/13;H01L23/492;H01L23/538;H01L23/00;H01L21/56;H01L23/31 |
主分类号 |
H01L23/495 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A semiconductor device comprising:
a leadframe having a cavity in a main surface of the leadframe, wherein the cavity extends from a raised portion of the leadframe to a first edge of the leadframe, opposite the raised portion, and wherein the leadframe has only one raised portion and only one cavity; a first electrically conductive layer disposed on a base surface of the cavity, wherein the first electrically conductive layer comprises metal nanoparticles; and a first semiconductor chip having a first surface disposed on the first electrically conductive layer, wherein the first semiconductor chip comprises a first electrode on the first surface and a second electrode on a second surface, the second surface is opposite the first surface, and a sum of a height of the first electrically conductive layer and a height of the first semiconductor chip is within twenty microns of a height of the cavity. |
地址 |
Neubiberg DE |