发明名称 Method of manufacturing a semiconductor device with a carrier having a cavity and semiconductor device
摘要 A method includes providing a carrier having a first cavity, providing a dielectric foil with a metal layer attached to the dielectric foil, placing a first semiconductor chip in the first cavity of the carrier, and applying the dielectric foil to the carrier.
申请公布号 US9006873(B2) 申请公布日期 2015.04.14
申请号 US201313944595 申请日期 2013.07.17
申请人 Infineon Technologies AG 发明人 Nikitin Ivan;Mahler Joachim
分类号 H01L23/495;H01L23/34;H01L23/498;H01L23/13;H01L23/492;H01L23/538;H01L23/00;H01L21/56;H01L23/31 主分类号 H01L23/495
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A semiconductor device comprising: a leadframe having a cavity in a main surface of the leadframe, wherein the cavity extends from a raised portion of the leadframe to a first edge of the leadframe, opposite the raised portion, and wherein the leadframe has only one raised portion and only one cavity; a first electrically conductive layer disposed on a base surface of the cavity, wherein the first electrically conductive layer comprises metal nanoparticles; and a first semiconductor chip having a first surface disposed on the first electrically conductive layer, wherein the first semiconductor chip comprises a first electrode on the first surface and a second electrode on a second surface, the second surface is opposite the first surface, and a sum of a height of the first electrically conductive layer and a height of the first semiconductor chip is within twenty microns of a height of the cavity.
地址 Neubiberg DE