发明名称 |
PARTING METHOD OF WAFER LAMINATE FOR IMAGE SENSOR, AND PARTING DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a parting method of a wafer laminate for an image sensor and a parting device of the wafer laminate for the image sensor, by and with which the wafer laminate can be parted effectively and finely according to a dry-system simple technique without using a dicing saw.SOLUTION: A wafer laminate W for an image sensor is structured by bonding a glass wafer 1 and a silicon wafer 2 with a resin layer 4 which is disposed so as to surround photodiode formation regions 3. The parting method of the wafer laminate W for the image sensor includes: forming a scribe line S1 by pressing/rolling a scribing wheel 10 along a predetermined parting line on a top face of the glass wafer 1; next forming a scribe line S2 by pressing/rolling a diamond point cutter 25 including a protrusive blade point 25b at a tip of a blade body 25a, along a predetermined parting line on an outer surface of the silicon wafer 2; and then bending the wafer laminate W by pressing it with a pressing member 14 from the outer surface side of the silicon wafer 2 along the scribe line S2, such that the glass wafer 1 and the silicon wafer 2 are parted.</p> |
申请公布号 |
JP2015070135(A) |
申请公布日期 |
2015.04.13 |
申请号 |
JP20130203711 |
申请日期 |
2013.09.30 |
申请人 |
MITSUBOSHI DIAMOND INDUSTRIAL CO LTD |
发明人 |
KAMIMURA TAKEHIRO |
分类号 |
H01L21/301;B28D5/00;C03B33/027;C03B33/033;H01L27/14 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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