发明名称 RESISTOR ARRAY CIRCUIT, CURRENT GENERATION CIRCUIT, CURRENT-CONTROLLED OSCILLATION CIRCUIT, FLL CIRCUIT, AND METHOD OF TESTING RESISTOR ARRAY
摘要 <p>PROBLEM TO BE SOLVED: To shorten a test time by enabling a path test and a resistance value test to be performed separately.SOLUTION: A resistor array circuit includes: first switching elements Q-Qdisposed between respective resistive elements r of resistor units R-Rand relay points C-Ccorresponding to the respective resistive elements r; second switching elements Q-Qdisposed between the respective relay points C-Cand a potential V; third switching elements Q-Qdisposed between respective ends of the resistor units R-Rand the potential V; fourth switching elements Q-Qdisposed between respective opposite ends of the resistor units R-Rand a potential V; fifth switching elements Q-Qdisposed between the respective relay points C-Cand an output section 30; and control means for controlling on/off of the first to fifth switching elements.</p>
申请公布号 JP2015070306(A) 申请公布日期 2015.04.13
申请号 JP20130200280 申请日期 2013.09.26
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 ITO YUSUKE;OMORI TETSUO
分类号 H03M1/10;H03M1/74 主分类号 H03M1/10
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