| 摘要 |
<p>The purpose of the present invention is to provide a lower cost X ray thickness meter having a calibration curve calibration function. This X ray thickness meter is capable of measuring the plate thickness of a measurement subject on the basis of a detected dose and a calibration curve that are obtained by irradiating X rays on the measurement subject and executing calibration curve calibration which calibrates calibration curves. An X ray thickness meter main body stores a corrected curve indicating the rate of change in the detected dose amount at a plurality of calibration points defining a desired thickness for each disturbance factor that causes the detected dose to change. Also the main body is used when creating calibration curves and stores: the detected dose in a first state in which a calibration plate is not inserted into the X ray beam; the detected dose in a second state in which the calibration plate is inserted into the X ray beam; and the detected dose in a third state in which the X rays are blocked. Furthermore a corrected curve is used and after correcting the detected dose at each calibration point the calibration curve is calibrated on the basis of the corrected detected dose.</p> |
