| 摘要 |
FIELD: measurement equipment.SUBSTANCE: invention relates to thermal physics and may be used to determine extent of blackness of the surface of composite and thin-film materials. The device is applicable whole sample surface is heated, and registration of radiation temperature is carried out from the samples with coating and available value of blackness extent and from the samples without coating. The device provides for localisation of the measured section area by means of a special protective screen from noise impact, and also creation of a local heating area, stable by temperature and area from a special source of heat. Also application of an IR-mark is provided for preliminary identification of thermal field parameters and operation with least losses.EFFECT: increased validity of material surface blackness extent determination.7 cl, 5 dwg |
