发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To reduce warpage of a semiconductor substrate in which semiconductor devices are provided on both surfaces of the substrate.SOLUTION: A semiconductor device comprises on a surface of a semiconductor substrate 11, a compensation film 14 for generating a stress for cancelling warpage of the semiconductor substrate 11. The compensation film 14 does not cover the whole area of the semiconductor substrate 11 and has a plurality of opened window parts 15 which are arranged at a predetermined distance from each other in a linear shape or a lattice shape or arranged at a predetermined distance from each other in an island shape. The compensation film 14 is formed on a surface of the semiconductor substrate 11 or on a surface on the opposite side to the surface of the semiconductor substrate 11, or in a semiconductor device formed on the semiconductor substrate 11.</p>
申请公布号 JP2015065350(A) 申请公布日期 2015.04.09
申请号 JP20130199043 申请日期 2013.09.25
申请人 FUJI ELECTRIC CO LTD 发明人 KATANO TOMONORI
分类号 H01L21/02;H01L21/28;H01L21/3205;H01L21/768;H01L23/522;H01L25/07;H01L25/18;H01L29/12;H01L29/739;H01L29/78 主分类号 H01L21/02
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