发明名称 3-D NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A three-dimensional (3-D) nonvolatile memory device includes channel layers protruding perpendicular to a surface of a substrate, interlayer insulating layers and conductive layer patterns alternately formed to surround each of the channel layers, a slit formed between the channel layers, the slit penetrating the interlayer insulating layers and the conductive layer patterns, and an etch-stop layer formed on the surface of the substrate at the bottom of the slit.
申请公布号 US2015097229(A1) 申请公布日期 2015.04.09
申请号 US201414568968 申请日期 2014.12.12
申请人 SK hynix Inc. 发明人 HAN Joo Hee
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A three-dimensional (3-D) nonvolatile memory device, comprising: channel layers protruding perpendicular to a surface of a substrate; interlayer insulating layers and conductive layer patterns alternately formed to surround each of the channel layers; a slit faulted between the channel layers, the slit penetrating the interlayer insulating layers and the conductive layer patterns; and an etch-stop layer formed on the surface of the substrate at a bottom of the slit.
地址 Gyeonggi-do KR