发明名称 |
3-D NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A three-dimensional (3-D) nonvolatile memory device includes channel layers protruding perpendicular to a surface of a substrate, interlayer insulating layers and conductive layer patterns alternately formed to surround each of the channel layers, a slit formed between the channel layers, the slit penetrating the interlayer insulating layers and the conductive layer patterns, and an etch-stop layer formed on the surface of the substrate at the bottom of the slit. |
申请公布号 |
US2015097229(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
US201414568968 |
申请日期 |
2014.12.12 |
申请人 |
SK hynix Inc. |
发明人 |
HAN Joo Hee |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A three-dimensional (3-D) nonvolatile memory device, comprising:
channel layers protruding perpendicular to a surface of a substrate; interlayer insulating layers and conductive layer patterns alternately formed to surround each of the channel layers; a slit faulted between the channel layers, the slit penetrating the interlayer insulating layers and the conductive layer patterns; and an etch-stop layer formed on the surface of the substrate at a bottom of the slit. |
地址 |
Gyeonggi-do KR |