发明名称 |
METHOD FOR CLEANING ABRASIVE CLOTH AND METHOD FOR POLISHING WAFER |
摘要 |
<p>A method which comprises supplying a cleaning fluid to the surface of an abrasive cloth for polishing a wafer and thereby cleaning the abrasive cloth, characterized by cleaning the abrasive cloth for eight or more hours while supplying an aqueous sodium hydroxide or potassium hydroxide solution as the cleaning fluid to the surface of the abrasive cloth. Thus, provided are: an abrasive cloth cleaning method which can effectively clean an abrasive cloth and thus minimize the microscratches that occur on the surface of a polished wafer and that is associated with an increase in the operating time of the abrasive cloth and which makes it possible to use the abrasive cloth for a longer time; and a wafer polishing method.</p> |
申请公布号 |
WO2015049829(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
WO2014JP04492 |
申请日期 |
2014.09.02 |
申请人 |
SHIN-ETSU HANDOTAI CO.,LTD. |
发明人 |
SASAKI, TAKUYA |
分类号 |
B24B37/00;B24B37/04;B24B53/007;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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