发明名称 |
RECONFIGURING AN ASIC AT RUNTIME |
摘要 |
Methods for reconfiguring an ASIC at runtime without using voltage over scaling. A functional criticality of a set of logic in the ASIC is identified. Then, the set of logic are classified into a set of regions based on the functional criticality, each region of the set of regions having a target error threshold. Further, each region is power gated at runtime based on the functional criticality such that the target error threshold is achieved without using voltage over scaling. |
申请公布号 |
US2015100608(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
US201414506216 |
申请日期 |
2014.10.03 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Varadarajan Devanathan;Srinivasan Karthik;Gala Neel Talakshi |
分类号 |
H03K19/00;G06F7/50;G06F7/52;H03K19/177 |
主分类号 |
H03K19/00 |
代理机构 |
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代理人 |
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主权项 |
1. A computer implemented method for reconfiguring an application specific integrated circuit (ASIC) comprising:
identifying a functional criticality of a set of logic in the ASIC; classifying the set of logic into a set of regions based on the functional criticality, each region having a target error threshold; and power-gating each region at runtime based on the functional criticality such that the target error threshold is achieved without using voltage over scaling. |
地址 |
Dallas TX US |