| 发明名称 |
METHOD OF EVALUATING DEVICE INCLUDING NOISE SOURCE |
| 摘要 |
A method of evaluating a device includes a first electric circuit acting as a noise source and a second electric circuit which is likely to malfunction due to a noise signal. The method includes: obtaining malfunction frequency characteristics indicating magnitudes of a threshold noise signal causing malfunction of the second electric circuit; obtaining internal noise arrival frequency characteristics indicating magnitudes of an internal noise signal arriving at the second electric circuit from the first electric circuit; and comparing the malfunction frequency characteristics with the internal noise arrival frequency characteristics. |
| 申请公布号 |
US2015097575(A1) |
申请公布日期 |
2015.04.09 |
| 申请号 |
US201414506853 |
申请日期 |
2014.10.06 |
| 申请人 |
Rohm Co., Ltd. |
发明人 |
Hiraga Noriaki |
| 分类号 |
G01R31/00;G01R23/00 |
主分类号 |
G01R31/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of evaluating a device including a first electric circuit acting as a noise source and a second electric circuit caused to malfunction due to a noise signal, comprising:
obtaining malfunction frequency characteristics indicating magnitudes of a threshold noise signal causing malfunction of the second electric circuit; obtaining internal noise arrival frequency characteristics indicating magnitudes of an internal noise signal arriving at the second electric circuit from the first electric circuit; and comparing the malfunction frequency characteristics with the internal noise arrival frequency characteristics. |
| 地址 |
Kyoto JP |
