发明名称 High Density Dielectric Etch Stop Layer
摘要 A method of manufacturing an integrated circuit device includes forming an inter-level dielectric layer over a semiconductor substrate, forming a transformative layer over the inter-level dielectric layer, forming a protective layer over the transformative layer without allowing the transformative layer to undergo a substantive transformation, and after forming the protective layer, causing the transformative layer to undergo a volume-increasing transformation. The volume-increasing transformation produces a high density material that provides an effective etch stop.
申请公布号 US2015097288(A1) 申请公布日期 2015.04.09
申请号 US201314045054 申请日期 2013.10.03
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Liou Joung-Wei;Hsiaw Han-Ti;Lin Keng-Chu
分类号 H01L21/768;H01L21/48;H01L23/538 主分类号 H01L21/768
代理机构 代理人
主权项
地址 Hsin-Chu TW