发明名称 |
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR SETTING CORRECTION FILTER THEREOF |
摘要 |
<p>The same region of a sample is scanned with a charged particle beam at a first speed within a bandwidth range of a detection unit and a second speed which exceeds the upper bound of the bandwidth. A first amplitude spectrum which is obtained by frequency analyzing a first detection signal which is obtained by the scanning at the first speed is superpositioned with a first amplitude spectrum which is obtained in a different image capture condition. A degraded function which represents a frequency characteristic of the detection unit is computed using the superpositioned first spectrum and a second spectrum corresponding to a second detection signal. While the superpositioned frequency spectrum does not satisfy an amplitude condition, the image capture condition is changed and the process is returned to a first processing unit. If the superpositioned frequency spectrum satisfies the amplitude condition, a correction filter of the detection unit of a charged particle beam device is computed and set on the basis of an inverse function of the already computed degraded function.</p> |
申请公布号 |
WO2015050157(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
WO2014JP76284 |
申请日期 |
2014.10.01 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
WATANABE MASASHI;CHIBA HIROYUKI;HOSHINO YOSHINOBU;KAWAMATA SHIGERU |
分类号 |
H01J37/244;H01J37/22 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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